Large Format - Base Stages

LF-B

Large Format - Base Stages

These stages are ideal candidates to increase the travel and payload capacity of your microscope and optical profiling systems. 

The platforms quickly adapt Keyence VK and VR measurement heads to enable larger part measurement.  

A variety of accessories are available to meet the needs of customers in environments spanning from R&D to production.

Have questions? Contact an expert. 

  • Configured to accept VR and VK measurement heads
  • Built with larger travels to unlock more measurable surface volume
  • Designed with industrial positioning stages that increase payload capacity without sacrificing measurement accuracy
  • Thoughtfully selected vibration isolation bases and sturdy frames allow for machine placement in a variety of manufacturing environments
  • Custom designs to solve specific applications available upon request

Video Overview

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Turn your metrology challenge into project success.