Large Format - Expanded Platforms
LF-X
Large Format - Expanded Platforms
These larger scale positioning systems expand the physical boundaries and automation capabilities of Keyence VK laser microscopes.
Through the use of a scan automation software package your part of virtually any size and shape can be measured in a semi or fully-automated fashion.
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software for automated scan control
The XpansionUI software application enables large scan volumes and process automation. This application replaces native Keyence motion control functions with enhanced capabilities.
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Enabling Features
Motion Controller Support
Native support for the Aerotech Automation1 motion controller enables larger and more industrial positioning stages to be used.
User Tools
Measurement initiation, navigation image creation, large area stitching, teaching routines, and parameter library.
Advanced Tools
Built-in integration of other sensors, height checks and focus optimization, part rotation, rotary stage support, and fiducial registration.
Customization
This internally developed software application is customizable for unique application needs.
Using Industry Leading Measurement Analysis Tools
Measurement and Characterization
Measurement Data Reporting
Batch Analysis for Automation
XpansionUI Product Feature Video
Related Products
VR & VK-X
Base Platform
Larger travel stages that work with the standard software packages supplied with the VK-X and VR measurement devices from Keyence.
VHX
Digital Platform
Larger Stage Motion and Automated Scan Routines for Keyence VHX Digital Microscopes.