Covering Keyence VK-X series scanning microscopes. Scanning microscopes can be difficult to optimize over large surface areas since their measurement depth of field is so small. If the surface you are trying to measure has a slight tilt to it, or if there are localized height differences across it, it will be hard to find …
Height Sensors Resolve Microscope Focus Challenges Read More »
This paper explains floor vibration and how to measure it. It also shows the performance of laser confocal microscopes over a variety of floor conditions. Quick reference: Use this lookup table to determine the hardware you need Floor vibration characteristics cause large swings in microscope performance on the nano-scale Floor vibration characteristics may cause swings …
Floor vibration and its effect on microscope performance Read More »
Small influences make a big impact on precision measurement processes When working with sub-micron and nanometer-sized features any external vibration influence on the equipment will negatively impact resultant measurement data. External vibrations such as nearby machinery, people’s foot traffic, steady-state floor vibration, and other sources have a large impact on how clean the measurement data …
The Field of View Problem Microscopes are ideal for taking measurements at high magnification. They make measuring micro and nanoscale features simple. Specifically, measuring features within a microscope’s field of view is easy with off-the-shelf tools. However, when the features on the part being measured are not located within the microscope’s field of view it …
Understanding a major limitation of microscopes The advantages of microscopy are plentiful, but they have a common limitation. The measurement field of view is small which makes it hard to measure a larger surface. That’s where an extended travel positioning system helps. Whether you are working with a digital, confocal, or structured light microscope there …
Selecting a Positioning System for Your Microscope Read More »
Often, manufactured part measurement processes are impacted by misalignment between the measurement device and the part itself. Most measurement devices acquire their data in a grid or square format. Most of the time, the part being measured by these devices has its own orientation and structure to the features to be measured. A great example …
Motion Control Alignment Techniques for Part Rotation Read More »
3 ways to improve microscope usage in a production environment through automation. Automating a Very Manual Process Microscopy is often the ideal measurement method during the research and development phase of a new product or process. This is due to the high resolution, quality, and accuracy of the data that comes with a microscope. Microscopy …
Scaling Microscopy Processes for a Production Environment Read More »
When images are taken with a VK-X1000 series microscope you cannot measure the distance between separate images in the Keyence Multifile Analyzer, or any other software that Keyence offers. Measurements can only be performed within the images themselves. With the standard tools you can stitch together an area to get one large image, but there …
Using Global Position Information to Measure Large Parts Read More »
An Innovation Forum Webinar (Link to Register). Join us on May 18th 2021 for a topical conference on metrology. We will be presenting a few important considerations that enable our users to measure much larger parts while retaining the same microscale precision they are accustomed to when using their laboratory benchtop tools.
