When images are taken with a VK-X1000 series microscope you cannot measure the distance between separate images in the Keyence Multifile Analyzer, or any other software that Keyence offers. Measurements can only be performed within the images themselves. With the standard tools you can stitch together an area to get one large image, but there …
Using Global Position Information to Measure Large Parts Read More »
An Innovation Forum Webinar (Link to Register). Join us on May 18th 2021 for a topical conference on metrology. We will be presenting a few important considerations that enable our users to measure much larger parts while retaining the same microscale precision they are accustomed to when using their laboratory benchtop tools.
<meta name=”robots” content=”noindex”> Over the past few years, our customers have come to us with consistent challenges surrounding their metrology equipment used for precision surface measurement. Off-the-shelf metrology tool limitations forced them to look elsewhere. Not enough precision, not enough automation, and not the right measurement technology were all reasons that pushed to find alternatives. …
