Displays are constantly being developed with higher resolutions and larger screen sizes. The complexity of modern displays makes measuring the components a challenge. Intricate features of a display can be measured using microscopy, however microscopy techniques are often limited to smaller sample sizes. Peak Metrology offers larger positioning tables and stages to support large area microscopy which …
The VR microscope from Keyence has built in larger stage control and image stitching capabilities. This is useful for measuring larger parts that are greater than 200mm in any one XY dimension. There are a few important considerations to keep in mind when performing measurements over a larger area with this microscope. 1. There is …
Maintain resolution over large areas – VR Microscopes Read More »
Covering Keyence VK-X series scanning microscopes. Scanning microscopes can be difficult to optimize over large surface areas since their measurement depth of field is so small. If the surface you are trying to measure has a slight tilt to it, or if there are localized height differences across it, it will be hard to find …
Height Sensors Resolve Microscope Focus Challenges Read More »
Shadowing occurs when the laser is blocked by a part surface while trying to return to the sensor head. The problem: Missing surface data The triangulation principle, such as the one used by laser measurement devices, often has a limitation when it comes to measuring surfaces with tall features. These tall features obstruct the outgoing …
Removing shadowing effects when using laser triangulation sensors Read More »
This paper explains floor vibration and how to measure it. It also shows the performance of laser confocal microscopes over a variety of floor conditions. Quick reference: Use this lookup table to determine the hardware you need Floor vibration characteristics cause large swings in microscope performance on the nano-scale Floor vibration characteristics may cause swings …
Floor vibration and its effect on microscope performance Read More »
New partnership enables core technologies for digital microscopes PITTSBURGH, Nov 22, 2021 – Peak Metrology, a surface metrology capital equipment manufacturer, today announced the partnership with IDC MicroInspection. This partnership combines the equipment and hardware capabilities of Peak Metrology with the process knowledge and application software of IDC MicroInspection. Now, digital microscope customers benefit from …
Peak Metrology Partners With IDC MicroInspection Read More »
Small influences make a big impact on precision measurement processes When working with sub-micron and nanometer-sized features any external vibration influence on the equipment will negatively impact resultant measurement data. External vibrations such as nearby machinery, people’s foot traffic, steady-state floor vibration, and other sources have a large impact on how clean the measurement data …
Larger travel stages from Peak Metrology maintains measurement repeatability Often, larger travel stages are needed to expand the measurement volume of VR Optical Profilers from Keyence. These measurement heads have smaller, high-precision individual fields of view, but come with software capable of stitching these smaller areas together. Overlapping data regions are used to combine the …
The Field of View Problem Microscopes are ideal for taking measurements at high magnification. They make measuring micro and nanoscale features simple. Specifically, measuring features within a microscope’s field of view is easy with off-the-shelf tools. However, when the features on the part being measured are not located within the microscope’s field of view it …
Understanding a major limitation of microscopes The advantages of microscopy are plentiful, but they have a common limitation. The measurement field of view is small which makes it hard to measure a larger surface. That’s where an extended travel positioning system helps. Whether you are working with a digital, confocal, or structured light microscope there …
Selecting a Positioning System for Your Microscope Read More »
