The Field of View Problem Microscopes are ideal for taking measurements at high magnification. They make measuring micro and nanoscale features simple. Specifically, measuring features within a microscope’s field of view is easy with off-the-shelf tools. However, when the features on the part being measured are not located within the microscope’s field of view it …
Understanding a major limitation of microscopes The advantages of microscopy are plentiful, but they have a common limitation. The measurement field of view is small which makes it hard to measure a larger surface. That’s where an extended travel positioning system helps. Whether you are working with a digital, confocal, or structured light microscope there …
Selecting a Positioning System for Your Microscope Read More »
New Company Already Delivering Metrology Solutions to Customers PITTSBURGH, July 27, 2021 – Aerotech Inc., a global leader in precision motion control and automation, today announced the launch of Peak Metrology, an Aerotech company dedicated entirely to designing and building capital equipment for surface metrology processes. Led by RJ Hardt, a 10-year Aerotech veteran, Peak …
Often, manufactured part measurement processes are impacted by misalignment between the measurement device and the part itself. Most measurement devices acquire their data in a grid or square format. Most of the time, the part being measured by these devices has its own orientation and structure to the features to be measured. A great example …
Motion Control Alignment Techniques for Part Rotation Read More »
3 ways to improve microscope usage in a production environment through automation. Automating a Very Manual Process Microscopy is often the ideal measurement method during the research and development phase of a new product or process. This is due to the high resolution, quality, and accuracy of the data that comes with a microscope. Microscopy …
Scaling Microscopy Processes for a Production Environment Read More »
When images are taken with a VK-X1000 series microscope you cannot measure the distance between separate images in the Keyence Multifile Analyzer, or any other software that Keyence offers. Measurements can only be performed within the images themselves. With the standard tools you can stitch together an area to get one large image, but there …
Using Global Position Information to Measure Large Parts Read More »
An Innovation Forum Webinar (Link to Register). Join us on May 18th 2021 for a topical conference on metrology. We will be presenting a few important considerations that enable our users to measure much larger parts while retaining the same microscale precision they are accustomed to when using their laboratory benchtop tools.
<meta name=”robots” content=”noindex”> Over the past few years, our customers have come to us with consistent challenges surrounding their metrology equipment used for precision surface measurement. Off-the-shelf metrology tool limitations forced them to look elsewhere. Not enough precision, not enough automation, and not the right measurement technology were all reasons that pushed to find alternatives. …
