Digital microscopes typically take and record images using JPEG or TIFF file formats. If desired, image compression algorithms are then applied. Here are the main benefits. Image your whole surface while maintaining your resolution Using smart image compression techniques will allow you to zoom in on a large surface. The resolution will be maintained and …
Displays are constantly being developed with higher resolutions and larger screen sizes. The complexity of modern displays makes measuring the components a challenge. Intricate features of a display can be measured using microscopy, however microscopy techniques are often limited to smaller sample sizes. Peak Metrology offers larger positioning tables and stages to support large area microscopy which …
The VR microscope from Keyence has built in larger stage control and image stitching capabilities. This is useful for measuring larger parts that are greater than 200mm in any one XY dimension. There are a few important considerations to keep in mind when performing measurements over a larger area with this microscope. 1. There is …
Maintain resolution over large areas – VR Microscopes Read More »
Small influences make a big impact on precision measurement processes When working with sub-micron and nanometer-sized features any external vibration influence on the equipment will negatively impact resultant measurement data. External vibrations such as nearby machinery, people’s foot traffic, steady-state floor vibration, and other sources have a large impact on how clean the measurement data …
Larger travel stages from Peak Metrology maintains measurement repeatability Often, larger travel stages are needed to expand the measurement volume of VR Optical Profilers from Keyence. These measurement heads have smaller, high-precision individual fields of view, but come with software capable of stitching these smaller areas together. Overlapping data regions are used to combine the …
The Field of View Problem Microscopes are ideal for taking measurements at high magnification. They make measuring micro and nanoscale features simple. Specifically, measuring features within a microscope’s field of view is easy with off-the-shelf tools. However, when the features on the part being measured are not located within the microscope’s field of view it …
