Displays are constantly being developed with higher resolutions and larger screen sizes. The complexity of modern displays makes measuring the components a challenge. Intricate features of a display can be measured using microscopy, however microscopy techniques are often limited to smaller sample sizes. Peak Metrology offers larger positioning tables and stages to support large area microscopy which …
Covering Keyence VK-X series scanning microscopes. Scanning microscopes can be difficult to optimize over large surface areas since their measurement depth of field is so small. If the surface you are trying to measure has a slight tilt to it, or if there are localized height differences across it, it will be hard to find …
Height Sensors Resolve Microscope Focus Challenges Read More »
New partnership enables core technologies for digital microscopes PITTSBURGH, Nov 22, 2021 – Peak Metrology, a surface metrology capital equipment manufacturer, today announced the partnership with IDC MicroInspection. This partnership combines the equipment and hardware capabilities of Peak Metrology with the process knowledge and application software of IDC MicroInspection. Now, digital microscope customers benefit from …
Peak Metrology Partners With IDC MicroInspection Read More »
Small influences make a big impact on precision measurement processes When working with sub-micron and nanometer-sized features any external vibration influence on the equipment will negatively impact resultant measurement data. External vibrations such as nearby machinery, people’s foot traffic, steady-state floor vibration, and other sources have a large impact on how clean the measurement data …
The Field of View Problem Microscopes are ideal for taking measurements at high magnification. They make measuring micro and nanoscale features simple. Specifically, measuring features within a microscope’s field of view is easy with off-the-shelf tools. However, when the features on the part being measured are not located within the microscope’s field of view it …
